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SP1481E/SP1485E Enhanced Low Power Half-Duplex RS-485 Transceivers
+5VOnly LowPowerBiCMOS Driver/ReceiverEnableforMulti-Drop configurations LowPowerShutdownMode (SP48E) EnhancedESDSpecifications: +15KVHumanBodyModel +15KVIEC1000-4-2AirDischarge +8KVIEC1000-4-2ContactDischarge
RO 1 RE 2 DE 3 DI 4
R
8 VCC 7B 6A
D
5 GND
NowAvailableinLeadFreePackaging description The SP1481E and the SP1485E are a family of half-duplex transceivers that meet the specificationsofRS-485andRS-422serialprotocolswithenhancedESDperformance.The ESDtolerancehasbeenimprovedonthesedevicestoover+15KVforbothHumanBody Model and IEC1000-4-2Air Discharge Method. These devices are pin-to-pin compatible withExar'sSP481andSP485devicesaswellaspopularindustrystandards.Aswiththe originalversions,theSP1481EandtheSP1485EfeatureExar'sBiCMOSdesignallowing lowpoweroperationwithoutsacrificingperformance.TheSP1481EandSP1485Emeetthe requirementsoftheRS-485andRS-422protocolsupto20Mbpsunderload.TheSP1481E isequippedwithalowpowerShutdownmode.
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SP48E-485E_00_06609
ABsoLUte MAXiMUM rAtinGs
OutputVoltages
Thesearestressratingsonlyandfunctionaloperationofthedeviceat theseratingsoranyotherabovethoseindicatedintheoperationsections ofthespecificationsbelowisnotimplied.Exposuretoabsolutemaximum ratingconditionsforextendedperiodsoftimemayaffectreliability. VCC..............................................................................+7V InputVoltages Logic...................................................-0.3Vto(VCC+0.5V) Drivers................................................-0.3Vto(VCC+0.5V) Receivers.................................................................15V
Logic.............................................-0.3Vto(VCC+0.5V) Drivers................................................................15V Receivers......................................-0.3Vto(VCC+0.5V) StorageTemperature.....................................................-65Cto+150C PowerDissipationperPackage 8-pinNSOIC(derate6.60mW/oCabove+70oC).........................550mW
eLectricAL cHArActeristics
TMINto TMAXandVCC=5V5%unlessotherwisenoted.
pArAMeters SP1481E/sp1485e driver dc characteristics DifferentialOutputVoltage DifferentialOutputVoltage DifferentialOutputVoltage ChangeinMagnitudeofDriver DifferentialOutputVoltagefor ComplimentaryStates DriverCommon-Mode OutputVoltage InputHighVoltage InputLowVoltage InputCurrent DriverShort-CircuitCurrent VOUT=HIGH VOUT=LOW SP1481E/sp1485e driver Ac characteristics MaximumDataRate DriverInputtoOutput DriverInputtoOutput (SP1485EMNONLY) DriverInputtoOutput DriverInputtoOutput (SP1485EMNONLY) DriverSkew DriverRiseorFallTime DriverEnabletoOutputHigh DriverEnabletoOutputLow DriverDisableTimefromLow DriverDisableTimefromHigh
Min.
tYp.
MAX.
Units
conditions
3.5 2 1.5 2.0

VCC VCC VCC
Volts Volts Volts
Unloaded;R=;seeFigure1 withload;R=50;(RS-422); seeFigure1 withload;R=27;(RS-485);seeFigure1
0.2 3 0.8 10 250 250
Volts Volts Volts Volts A mA mA
R=27orR=50;seeFigure1 R=27orR=50;seeFigure1 AppliestoDE,DI,RE AppliestoDE,DI,RE AppliestoDE,DI,RE -7VVO+12V -7VVO+12V
20
20 20 20 20 3 8 40 40 40 40
30 40 30 40 5 20 70 70 70 70
Mbps ns ns ns ns ns ns ns ns ns ns
RE=5V,DE=5V;RDIFF=54, CL1 = CL2 = 00pF tPLH;RDIFF=54,CL1 = CL2=100pF; seeFigures3and5 tPLH;RDIFF=54,CLI= CL2=100pF; SeeFigures3and5 tPHL;RDIFF=54,CL1 = CL2=100pF; seeFigures3and5 tPHL;RDIFF=54,CL1 = CL2=100pF; seeFigures3and5 seeFigures3and5, tSKEW = | tPLH - tPHL | From10%to90%;RDIFF=54, CL1 = CL2=100pF;seeFigures3&6 CL=100pF;seeFigures4&6;S2closed CL=100pF;seeFigures4&6;Sclosed CL=100pF;seeFigures4&6;Sclosed CL=100pF;seeFigures4&6;S2 closed
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SP48E-485E_00_06609
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TMINto TMAXandVCC=5V5%unlessotherwisenoted pArAMeters SP1481E/sp1485e receiver dc characteristics DifferentialInputThreshold DifferentialInputThreshold (SP1485EMNONLY) InputHysteresis OutputVoltageHigh OutputVoltageLow Three-State(HighImpedance) OutputCurrent InputResistance InputCurrent(A,B);VIN=12V InputCurrent(A,B);VIN=-7V 12 15 1 +1.0 -0.8 95 A k mA mA mA 0.4VVO2.4V;RE=5V -7VVCM+12V DE=0V,VCC=0Vor5.25V,VIN=12V DE=0V,VCC=0Vor5.25V,VIN=-7V 0VVOVCC 3.5 20 0.4 mV Volts Volts VCM=0V IO=-4mA,VID=+200mV IO=+4mA,VID=-200mV -0.2 -0.4 +0.2 +0.4 Volts Volts -7VVCM+12V -7VVCM+12V Min. tYp. MAX. Units conditions
speciFicAtions (continued)
Short-CircuitCurrent7 SP1481E/sp1485e receiver Ac characteristics MaximumDataRate ReceiverInputtoOutput ReceiverInputtoOutput Diff.ReceiverSkewItPLH-tPHLI ReceiverEnableto OutputLow ReceiverEnableto OutputHigh ReceiverDisablefromLow SP1481E shutdown timing TimetoShutdown DriverEnablefromShutdown toOutputHigh DriverEnablefromShutdown toOutputLow ReceiverEnablefrom ShutdowntoOutputHigh ReceiverEnablefrom ShutdowntoOutputLow poWer reQUireMents SupplyVoltage SupplyCurrent SP1481E/1485E NoLoad SP48E ShutdownMode environMentAL And MecHAnicAL OperatingTemperature Commercial(_C_) Industrial(_E_) (_M_) StorageTemperature Package NSOIC(_N) 0 -40 -40 -65 +4.75 50 20
25 25 5 45 45 45
70 70 10 70 70 70 70
Mbps ns ns ns ns ns ns ns
RE=0V,DE=0V tPLH;RDIFF=54, CL1 = CL2 = 100pF;Figures3&7 tPHL;RDIFF=54, CL1 = CL2 = 100pF;Figures3&7 RDIFF=54;CL1= CL2=100pF; Figures3&7 CRL=15pF;Figures2&8;Sclosed CRL=15pF;Figures2&8;S2closed CRL=15pF;Figures2&8;Sclosed CRL=15pF;Figures2&8;S2closed
ReceiverDisablefromHigh45
200 40 40 300 300 900 600
600 100 100 1000 1000 +5.25 10
ns ns ns ns ns Volts A A A
RE=5V,DE=0V CL=100pF;SeeFigures4&6;S2closed CL=100pF;SeeFigures4&6;Sclosed CL=15pF;SeeFigures2&8;S2closed CL=15pF;SeeFigures2&8;Sclosed
RE,DI=0VorVCC;DE=VCC RE=0V,DI=0Vor5V;DE=0V DE=0V,RE=VCC

+70 +85 +125 +150
C C C C
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SP48E-485E_00_06609
3
pin FUnction
RO 1 RE 2 DE 3 DI 4
R
8 7 6
VCC B A GND
Pin1-RO-ReceiverOutput. Pin2-RE-ReceiverOutputEnableActiveLOW. Pin3-DE-DriverOutputEnableActiveHIGH. Pin4-DI-DriverInput. Pin5-GND-GroundConnection.
D
SP485
Top View
5
Pin6-A-DriverOutput/ReceiverInputNon-inverting. Pin7-B-DriverOutput/ReceiverInputInverting. Pin8-Vcc-PositiveSupply4.75VSP48E and SP485E Pinout(TopView)
A R VOD R B
Figure1.RS-485DriverDCTestLoadCircuit
3V DE DI A B RDIFF CL2 CL1 A B RO 15pF
Receiver Output CRL
Test Point S1 1K S2
1K VCC
VOC
Figure2.ReceiverTimingTestLoadCircuit
Output Under Test CL
500
S1
VCC
S2
Figure3.RS-485Driver/ReceiverTimingTestCircuit Figure4.RS-485DriverTimingTestLoad#2Circuit
DI DRIVER OUTPUT
+3V 0V B A VO 1/2VO
f = 1MHz; tR < 1ns; tF < 1ns 1.5V tPLH tPHL 1.5V tPLH 1/2VO tSKEW tSKEW
DIFFERENTIAL VO+ OUTPUT 0V VA - VB VO-
Figure5.DriverPropagationDelays
tR
tF
SP48E-485E_00_06609
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INPUTS LINE DI CONDITION 1 0 X X NoFault NoFault X Fault
OUTPUTS B 0 1 Z Z A 1 0 Z Z

INPUTS RE 0 0 0 1 DE 0 0 0 0 A-B +0.2V -0.2V InputsOpen X
OUTPUTS R 1 0 1 Z
RE DE X X X X 1 1 0 1
Table2.ReceiveFunctionTruthTable
Table1.TransmitFunctionTruthTable
f = 1MHz; f= tR < 1ns; tF < 1ns DE +3V 0V 5V VOL VOH 0V 1.5V tZL 2.3V Output normally LOW Output normally HIGH 1.5V tLZ 0.5V 0.5V tHZ
A, B
A, B
2.3V tZH
Figure6.DriverEnableandDisableTimes
A-B
V0D2+ V0D2- VOH VOL tPHL
0V
INPUT 1.5V
0V
R
tPHL f = 1MHz; tR < 1ns; tF < 1ns
OUTPUT
1.5V
Figure7.ReceiverPropagationDelays
RE
+3V 0V 5V VIL VIH 0V
f = 1MHz; tR < 1ns; tF < 1ns 1.5V tZL 1.5V Output normally LOW Output normally HIGH 1.5V tLZ 0.5V 0.5V tHZ
R
R
1.5V tZH
Figure8.ReceiverEnableandDisableTimes
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description TheSP1481EandSP1485Earehalf-duplex differentialtransceiversthatmeettherequirementsofRS-485andRS-422.Fabricated with a Exar proprietary BiCMOS process, theseproductsrequireafractionofthepower ofolderbipolardesigns. TheRS-485standardisidealformulti-drop applicationsandforlong-distanceinterfaces. RS-485allowsupto32driversand32receiverstobeconnectedtoadatabus,makingit anidealchoiceformulti-dropapplications. Sincethecablingcanbeaslongas4,000 feet,RS-485transceiversareequippedwith awide(-7Vto+12V)commonmoderange to accommodate ground potential differences. Because RS-485 is a differential interface,dataisvirtuallyimmunetonoise inthetransmissionline. drivers The driver outputs of the SP1481E and SP1485Earedifferentialoutputsmeetingthe RS-485andRS-422standards.Thetypical voltageoutputswingwithnoloadwillbe0 Voltsto+5Volts.Withworstcaseloading of54acrossthedifferentialoutputs,the driverscanmaintaingreaterthan1.5Vvoltagelevels.ThedriversoftheSP1481E,and SP1485Ehaveanenablecontrollinewhich isactiveHIGH.AlogicHIGHonDE(pin3) willenablethedifferentialdriveroutputs.A logic LOW on DE (pin 3) will tri-state the driveroutputs. The transmitters of the SP1481E and SP1485E will operate up to at least 20Mbps. receivers TheSP1481EandSP1485Ereceivershave differential inputs with an input sensitivity aslowas200mV.Inputimpedanceofthe receiversistypically15k(12kminimum). Awidecommonmoderangeof-7Vto+12V allowsforlargegroundpotentialdifferences between systems. The receivers of the SP1481E and SP1485E have a tri-state enablecontrolpin.
6
AlogicLOWonRE(pin2)willenablethe receiver,alogicHIGHonRE(pin2)willdisablethereceiver. ThereceiverfortheSP1481EandSP1485E willoperateuptoatleast20Mbps.Thereceiver foreachofthetwodevicesisequippedwiththe fail-safefeature.Fail-safeguaranteesthatthe receiveroutputwillbeinaHIGHstatewhen theinputisleftunconnected. shutdown Mode SP1481E TheSP1481EisequippedwithaShutdown mode.ToenabletheShutdownstate,both the driver and receiver must be disabled simultaneously. AlogicLOWonDE(pin3)andalogicHIGH onRE(pin2)willputtheSP1481EintoShutdownmode.InShutdown,supplycurrentwill droptotypically1A. esd toLerAnce The SP1481E Family incorporates ruggedizedESDcellsonalldriveroutputand receiver input pins. The ESD structure is improvedoverourpreviousfamilyformore rugged applications and environments sensitive to electro-static discharges and associatedtransients.TheimprovedESD toleranceisatleast15kVwithoutdamage norlatch-up. TherearedifferentmethodsofESDtesting applied: a)MIL-STD-883,Method3015.7 b)IEC1000-4-2Air-Discharge c)IEC1000-4-2DirectContact The Human Body Model has been the generally accepted ESD testing method for semiconductors. This method is also specified in MIL-STD-883, Method 3015.7 for ESD testing. The premise of this ESD testistosimulatethehumanbody'spotential tostoreelectro-staticenergyanddischarge ittoanintegratedcircuit.Thesimulationis performedbyusingatestmodelasshown inFigure7.ThismethodwilltesttheIC's capabilitytowithstandanESDtransientduringnormalhandlingsuchasinmanufacturingareaswheretheICstendtobehandled frequently.
SP48E-485E_00_06609
Exar Corporation 48720 Kato Road, Fremont CA, 94538 * 50-668-707 * www.exar.com
The IEC-1000-4-2, formerly IEC801-2, is generallyusedfortestingESDonequipment and systems. For system manufacturers, theymustguaranteeacertainamountofESD protectionsincethesystemitselfisexposed totheoutsideenvironmentandhumanpresence.ThepremisewithIEC1000-4-2isthat thesystemisrequiredtowithstandanamount ofstaticelectricitywhenESDisappliedto pointsandsurfacesoftheequipmentthat areaccessibletopersonnelduringnormal usage. The transceiver IC receives most oftheESDcurrentwhentheESDsource isappliedtotheconnectorpins.Thetest circuitforIEC1000-4-2isshownonFigure8.
TherearetwomethodswithinIEC1000-4-2, theAirDischargemethodandtheContact Dischargemethod.
RC RC SW1 SW1
DC Power Source
RS RS SW2 SW2 CS CS
Device Under Test
Figure7.ESDTestCircuitforHumanBodyModel
Contact-Discharge Module
RC RC SW1 SW1
DC Power Source
RS RS
RV SW2 SW2
CS CS
Device Under Test
RS and RV add up to 330 for IEC1000-4-2. for
Figure8.ESDTestCircuitforIEC1000-4-2
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With the Air Discharge Method, an ESD voltageisappliedtotheequipmentunder test(EUT)throughair.Thissimulatesan electricallychargedpersonreadytoconnect acableontotherearofthesystemonlyto findanunpleasantzapjustbeforetheperson touchesthebackpanel.Thehighenergy potentialonthepersondischargesthrough anarcingpathtotherearpanelofthesystem beforeheorsheeventouchesthesystem. Thisenergy,whetherdischargeddirectlyor throughair,ispredominantlyafunctionofthe dischargecurrentratherthanthedischarge voltage.Variableswithanairdischargesuch asapproachspeedoftheobjectcarryingthe ESDpotentialtothesystemandhumidity will tend to change the discharge current. Forexample,therisetimeofthedischarge currentvarieswiththeapproachspeed. TheContactDischargeMethodappliesthe ESDcurrentdirectlytotheEUT.Thismethod wasdevisedtoreducetheunpredictability oftheESDarc.Thedischargecurrentrise timeisconstantsincetheenergyisdirectly transferredwithouttheair-gaparc.Insituationssuchashandheldsystems,theESD charge can be directly discharged to the equipment from a person already holding theequipment.Thecurrentistransferred on to the keypad or the serial port of the equipmentdirectlyandthentravelsthrough thePCBandfinallytotheIC. ThecircuitmodelinFigures7and8represent the typical ESD testing circuit used for all threemethods.TheCSisinitiallycharged with the DC power supply when the first
30A
5A
0A t=0ns t=30ns
t
Figure9.ESDTestWaveformforIEC1000-4-2
switch(SW1)ison.Nowthatthecapacitor ischarged,thesecondswitch(SW2)ison whileSW1switchesoff.Thevoltagestored inthecapacitoristhenappliedthroughRS, thecurrentlimitingresistor,ontothedevice undertest(DUT).InESDtests,theSW2 switch is pulsed so that the device under testreceivesadurationofvoltage. For the Human Body Model, the current limitingresistor(RS)andthesourcecapacitor (CS)are1.5kan100pF,respectively.For IEC-1000-4-2, the current limiting resistor (RS)andthesourcecapacitor(CS)are330 an150pF,respectively. ThehigherCSvalueandlowerRSvaluein theIEC1000-4-2modelaremorestringent than the Human Body Model. The larger storage capacitor injects a higher voltage tothetestpointwhenSW2isswitchedon. Thelowercurrentlimitingresistorincreases thecurrentchargeontothetestpoint.
SP1481E, SP1485E FamiLy
HUMAn BodY ModeL

Air discharge
iec1000-4-2 direct contact
Level
4 4
DriverOutputs 15kV ReceiverInputs 15kV
15kV 8kV 15kV 8kV
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SP48E-485E_00_06609
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orderinG inForMAtion
Model temperature range package SP1481ECN-L ................................................... 0Cto+70C ............................................... 8-pinNarrowSOIC SP1481ECN-L/TR ..............................................0Cto+70C............................................... 8-pinNarrowSOIC SP1481EEN-L ................................................. .-40Cto+85C ............................................. 8-pinNarrowSOIC SP1481EEN-L/TR ........................................... .-40Cto+85C ............................................. 8-pinNarrowSOIC SP1485ECN-L ................................................... 0Cto+70C ............................................... 8-pinNarrowSOIC SP1485ECN-L/TR ............................................. 0Cto+70C ............................................... 8-pinNarrowSOIC SP1485EEN-L ..................................................-40Cto+85C.............................................. 8-pinNarrowSOIC SP1485EEN-L/TR ............................................-40Cto+85C.............................................. 8-pinNarrowSOIC SP1485EMN-L ................................................-40Cto+125C............................................. 8-pinNarrowSOIC
DATE 03/08/07 06/16/09
REVISION DESCRIPTION J .0.0 LegacySipexDatasheet ConverttoExarformat,updateorderinginformationand changerevisionto1.0.0
Notice EXARCorporationreservestherighttomakechangestoanyproductscontainedinthispublicationinordertoimprovedesign,performanceorreliability.EXARCorporationassumesnorepresentationthatthecircuitsarefreeofpatentinfringement.Chartsandschedulescontainedhereinare onlyforillustrationpurposesandmayvarydependinguponauser'sspecificapplication.Whiletheinformationinthispublicationhasbeencarefully checked;noresponsibility,however,isassumedforinaccuracies. EXARCorporationdoesnotrecommendtheuseofanyofitsproductsinlifesupportapplicationswherethefailureormalfunctionoftheproductcan reasonablybeexpectedtocausefailureofthelifesupportsystemortosignificantlyaffectitssafetyoreffectiveness.Productsarenotauthorizedfor useinsuchapplicationsunlessEXARCorporationreceives,inwritting,assurancestoitssatisfactionthat:(a)theriskofinjuryordamagehasbeen minimized;(b)theuserassumesallsuchrisks;(c)potentialliabilityofEXARCorporationisadequatelyprotectedunderthecircumstances. Copyright2009EXARCorporation DatasheetJune2009 SendyourInterfacetechnicalinquirywithtechnicaldetailsto:uarttechsupport@exar.com Reproduction,inpartorwhole,withoutthepriorwrittenconsentofEXARCorporationisprohibited.
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